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CORDE Electron Ion Beam Microscopy

The CORDE Electron and Ion Microscopy facility enables users to undertake scanning electron microscopy imaging and chemical analysis and focused ion beam nanofabrication and engineering and sample preparation.

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Our capabilities

  • Low kV high resolution imaging
  • TEM sample preparation
  • FIB slice and view
  • Large area mapping
  • Nano patterning and nanoengineering