The West Cambridge Sharing Equipment Directory now includes the X-ray and Electron Microscopy Suite at the Department of Earth Sciences for solid material characterisation.
- The Electron Probe MicroAnalyser (EPMA) is a non-destructive technique for the analysis of polished solid materials. The suite includes a Jeol Field Emission Gun (FEG) JXA-iHP200F microprobe, which is equipped with 5 wavelength dispersive spectrometers (WDS), and EDS detector, panchromatic CL detector and and IBSS plasma cleaner. There is also a probe for EPMA (PfE) available for chemical analysis and elemental mapping.
- The Field Emission Gun Scanning Electron Microscope (FEG-SEM) is equipped with BSE, SE, GSED, LFD, panchromatic CL and in February 2024 was fitted with an Oxford Instruments Symmetry S3 EBSD and Ultim Max 170 EDS detectors. Several software packages including MAPS, Esprit (for Bruker EDS/EBSD data collected pre February 2024) and a full AZtec 6.1 SP2 licence with Mapsweeper and AZtecCrystal allow for a comprehensive list of techniques to be used in tandem to fully explore and interrogate a given sample.
