About us
The Quanta-650F Scanning electron Microscope (SEM) is large chamber SEM equipped with BSE, SE and panchromatic CL that can be run at high vacuum, low vacuum or environmental mode. This allows for imaging/chemically analysing samples with or without a conductive coat. It is fitted with an Oxford Instruments Symmetry S3 EBSD and Ultim Max 170 EDS detectors.
The Jeol Field Emission Gun (FEG) JXA-iHP200F Electron Probe MicroAnalyser (EPMA) is equipped with 5 wavelength dispersive spectrometers (WDS), and EDS detector, panchromatic CL detector and an IBSS plasma cleaner. In addition to a full Jeol-EMPA software suite, we have Probe for EPMA (PfE) available for chemical analysis and elemental mapping.
The X-ray diffraction equipment is constituted by two modern powder diffractometers (Bruker D8 and Empyrean Panalytical) with different X-ray sources. The Empyrean Panalytical is equipped with a XRK900 Anton-Paar Reactor chamber and a slurry flow cell for in-situ experiments. The Bruker D8 mounts a HPC900 Anton-Paar pressurised gas chamber. We offer phase identification analysis and quantification of the phases with Rietveld refinements.
